The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Sep. 14, 2012
Applicants:

Manabu Shiozawa, Tokyo, JP;

Koichi Watanabe, Tokyo, JP;

Takao Watanabe, Tokyo, JP;

Inventors:

Manabu Shiozawa, Tokyo, JP;

Koichi Watanabe, Tokyo, JP;

Takao Watanabe, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/10 (2006.01); G03H 1/02 (2006.01); G11B 7/1267 (2012.01); G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
G11B 7/1267 (2013.01); G11B 2007/0013 (2013.01);
Abstract

When recording is performed by focusing a short pulse laser on an inside of a transparent medium such as quartz glass, and forming a minute deformed region in which the refractive index is different from that of surroundings thereof, it is difficult to ensure a recording quality. Therefore, a recorded dot length in a depth direction is monitored 111 and a power of the laser light is adjusted based on the monitored recorded dot length, or a difference between a focus position where a region of the recorded dots appears brighter than the surroundings and a focus position where the region of the recorded dots appears darker than the surroundings is measured and the power of the laser light is adjusted based on the difference.


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