The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Dec. 10, 2013
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Yanyan Yin, Beijing, CN;
Jing Xue, Beijing, CN;
Hongyan Xing, Beijing, CN;
Ziwei Cui, Beijing, CN;
Falong Han, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
A method, an apparatus and an equipment of inspecting the quality of an LCD are provided, the method includes: obtaining optical parameters of the LCD; capturing images of the LCD; and determining that the LCD is defective after determining that the optical parameters are not in the range of the preset optical parameters and/or the captured images of the LCD are not consistent with the pre-stored images. Through the technical solution of the present invention, it can effectively differentiate the defect types of a product and record the defect position of the product, thereby it can effectively reduce misjudgment or miss test caused by the visual differences between operators to improve the quality and yield of manufactured LCD.