The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jan. 31, 2017
Applicant:

Cognex Corporation, Natick, MA (US);

Inventor:

John McGarry, San Diego, CA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/38 (2006.01); G06K 9/40 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6249 (2013.01); G06K 9/38 (2013.01); G06K 9/40 (2013.01); G06K 9/6202 (2013.01); G06T 5/20 (2013.01);
Abstract

A method includes producing two or more measurements by an image sensor having a pixel array, the measurements including information contained in a set of sign-bits, the producing of each measurement including (i) forming an image signal on the pixel array; and (ii) comparing accumulated pixel currents output from pixels of the pixel array in accordance with the image signal and a set of pixel sampling patterns to produce the set of sign-bits of the measurement; buffering at least one of the measurements to form a buffered measurement; comparing information of the buffered measurement to information of the measurements to produce a differential measurement; and combining the differential measurement with information of the set of pixel sampling patterns to produce at least a portion of one or more digital images relating to one or more of the image signals formed on the pixel array.


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