The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jul. 18, 2012
Dakshi Agrawal, Monsey, NY (US);
Chatschik Bisdikian, Chappaqua, NY (US);
Dakshi Agrawal, Monsey, NY (US);
Chatschik Bisdikian, Chappaqua, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Quality of information (QoI) assessment in dynamic sensor networks that includes evaluating, by a computer, a first value reflective of available reports from sensors that are dynamically associated with the computer. A second value reflective of reports expected to have been available for evaluation about the observed phenomena is estimated. A QoI of the available reports is assessed. The assessing is based on the first value reflective of the available reports and the second value reflective of reports expected to have been available for evaluation. A third value, based on the assessing is output.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile