The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Oct. 30, 2014
Samsung Sds Co., Ltd., Seoul, KR;
Younghwan Namkoong, Seoul, KR;
Jaeyoung Lee, Seoul, KR;
Samsung SDS Co., Ltd., Seoul, KR;
Abstract
Disclosed are an automated management system and method for fault events of a data center. A fault event monitoring unit is configured to check statuses of servers to detect occurrence of a fault event, and if a fault event occurs, determine whether an automated action is possible. A fault event related action recommending unit is configured to, with respect to a fault event that is newly detected by the fault event monitoring unit or determined to be difficult to be resolved by an action stored in a fault event related action storage unit, search for and extract information related to the fault event determined to be difficult to be resolved from information accumulated in a fault event information knowledge storage unit, and based on the extracted information, generate and output a group of automated action candidates for the fault event determined to be difficult to be resolved. A fault event action unit is configured to automatically take an action against a fault event detected by the fault event monitoring unit by use of the action accumulated in the fault event related action storage.