The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Aug. 04, 2014
Applicant:

Dmg Mori Seiki Co., Ltd., Nara, JP;

Inventors:

Susumu Mitsuhashi, Nara, JP;

Takayuki Nakamura, Nara, JP;

Tetsushi Asada, Nara, JP;

Tetsuo Ogawa, Nara, JP;

Yuzuru Sakuta, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G05B 19/4061 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4061 (2013.01); G05B 2219/35316 (2013.01);
Abstract

An interference checking devicechecks, during machining using an NC machine tool, interference between structures of the NC machine tool, a tool and a workpiece, and includes an interference check processing unitvirtually moving models and checking the occurrence of interference based on a position control signal from a numerical controller, and an operation effect degree evaluating unitevaluating the degree of an effect of an operation on a possibility of the occurrence of interference. When a predetermined operation is performed during machining of a workpiece following a first workpiece, the interference check processing unitmoves the models at intervals determined based on the degree of the effect evaluated by the operation effect degree evaluating unit


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