The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jul. 25, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Masato Fujiwara, Tokyo, JP;

Atsuyoshi Shimamoto, Tokyo, JP;

Junichi Nishimura, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/10 (2006.01); G02B 23/26 (2006.01); G02B 23/24 (2006.01); A61B 1/00 (2006.01); G01J 1/42 (2006.01); A61B 1/06 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G02B 26/10 (2013.01); A61B 1/00006 (2013.01); A61B 1/00172 (2013.01); A61B 1/063 (2013.01); G01J 1/4257 (2013.01); G02B 23/2469 (2013.01); G02B 23/26 (2013.01); G02B 26/103 (2013.01); H04N 5/2354 (2013.01);
Abstract

Provided is an optical scanning observation apparatus including: a light source unit () for outputting laser light; a scanning part () for scanning, on an object of observation (), a condensing position of the laser light output from the light source; and a detection unit () for sampling signal light obtained through scanning of the laser light, and converting the signal light into an electric signal, in which a sampling time for detecting signal light per one sampling is varied in accordance with changes in scanning rate of the scanning part () scanning on the object of observation (). In this manner, variation in resolution of an image resulting from changes in scanning rate per each sampling can be reduced.


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