The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jul. 22, 2014
Applicant:

Pgs Geophysical As, Oslo, NO;

Inventors:

Shaoping Lu, Houston, TX (US);

Norman Daniel Whitmore, Jr., Houston, TX (US);

Alejandro Antonio Valenciano Mavilio, Bellaire, TX (US);

Nizar Chemingui, Houston, TX (US);

Andrew Long, West Perth, AU;

Grunde Rønholt, Oslo, NO;

Assignee:

PGS Geophysical AS, Oslo, NO;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/38 (2006.01); G01V 1/36 (2006.01); G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G01V 1/36 (2013.01); G01V 1/284 (2013.01); G01V 1/38 (2013.01); G01V 2210/56 (2013.01); G01V 2210/632 (2013.01); G01V 2210/74 (2013.01);
Abstract

One embodiment relates to a technological process for identifying a potential subsurface structure below a body of water. Three-dimensional seismic sensor data that includes at least two measured components is obtained. Up-going and down-going wavefields comprising multiples wavefields are constructed from the three-dimensional seismic sensor data by applying wavefield separation. The up-going and down-going wavefields are extrapolated to a reflector surface below a water bottom. An imaging condition is applied at the reflector surface to generate images that include information from the multiples wavefields. Angle gathers are constructed, where each angle gather is constructed by gathering the images generated using the multiples wavefields for a range of illumination angles. Other embodiments, aspects and features are also disclosed.


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