The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jul. 09, 2014
Applicants:

Dainippon Screen Mfg. Co., Ltd., Kyoto-shi, Kyoto, JP;

Osaka University, Suita-shi, Osaka, JP;

Inventors:

Hidetoshi Nakanishi, Kyoto, JP;

Akira Ito, Kyoto, JP;

Iwao Kawayama, Suita, JP;

Masayoshi Tonouchi, Suita, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02S 50/00 (2014.01); H02S 50/10 (2014.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/2605 (2013.01); H02S 50/00 (2013.01); H02S 50/10 (2014.12);
Abstract

A photo device inspection apparatus is an apparatus for inspecting a solar cell panel, which is a photo device. The photo device inspection apparatus includes an irradiation part configured to irradiate the solar cell panel with pulsed light radiated from a femtosecond laser, which is a light source, an electromagnetic wave detection part configured to detect a pulse of an electromagnetic wave radiated from the solar cell panel in response to irradiation with the pulsed light, and a current detection part configured to detect a current generated by the solar cell panel in response to irradiation with the pulsed light.


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