The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jun. 16, 2014
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

Matthew B. Marzynski, Seattle, WA (US);

Ricardo Rodriguez, Mill Creek, WA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/24 (2006.01); G01R 31/44 (2006.01);
U.S. Cl.
CPC ...
G01R 31/245 (2013.01); G01R 31/44 (2013.01);
Abstract

A fluorescent lamp testing devicehas a microcontrollerthat controls tests for ballast discrimination as well as gas integrity, ballast operation, filament continuity and line voltage. The ballast discrimination test is performed by the microcontrollerin combination with a photodiodeand high/low pass filter. Gas integrity is tested with pulse width modulation and a high-voltage, step-up transformer (PWM/T) circuitand an antenna. A built in continuity tester has input pinsto test the continuity of the filaments in the fluorescent lamp. The antennaand a voltage-divider/voltage-sensor connected to the secondary coil in the transformer test for ballast operation. A PCB conductive loop, rectifierand op amptest for line voltage.


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