The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Dec. 03, 2013
Applicants:

Russel J. Kerkman, Milwaukee, WI (US);

Ahmed Mohamed Sayed Ahmed, Mequon, WI (US);

Brian J. Seibel, Grafton, WI (US);

Shiv Gupta, Milwaukee, WI (US);

Prathamesh Ramesh Vadhavkar, Brown Deer, WI (US);

Inventors:

Russel J. Kerkman, Milwaukee, WI (US);

Ahmed Mohamed Sayed Ahmed, Mequon, WI (US);

Brian J. Seibel, Grafton, WI (US);

Shiv Gupta, Milwaukee, WI (US);

Prathamesh Ramesh Vadhavkar, Brown Deer, WI (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/02 (2006.01); G01R 27/08 (2006.01); G01R 31/02 (2006.01); G01R 31/42 (2006.01);
U.S. Cl.
CPC ...
G01R 27/02 (2013.01); G01R 31/028 (2013.01); G01R 31/42 (2013.01);
Abstract

Impedance detection methods and systems are presented for automatic computation of an electrical component impedance value at one or more specific frequencies of interest using quadrature voltage and current values generated by quadrature tracking filters based on sensed or measured voltage and current signals or values and a base frequency input.


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