The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Oct. 25, 2013
Applicant:
Sercel, Inc., Houston, TX (US);
Inventor:
John Hepp, Leander, TX (US);
Assignee:
SERCEL INC., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01V 13/00 (2006.01); G01H 3/00 (2006.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01); G01V 13/00 (2013.01); G01H 3/005 (2013.01); G01V 2210/14 (2013.01);
Abstract
There is a testing device for testing a sensor. The testing device includes a rotating mechanism; a first rotating plate connected to the rotating mechanism so that the first rotating plate rotates around an orbital axis (Z); a second plate rotatably attached to the first rotating plate at a rotating point, the second plate having a rotational axis (Z) offset from the orbital axis (Z) by a predetermined distance R; and a gripping mechanism attached to the second plate and configured to receive and fix the sensor relative to the second plate. The second plate follows a circular trajectory with constant attitude around the orbital axis (Z).