The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jan. 31, 2014
Applicant:
The Johns Hopkins University, Baltimore, MD (US);
Inventors:
Katsuyuki Taguchi, Elkridge, MD (US);
Somesh Srivastava, Waukesha, WI (US);
Assignee:
The Johns Hopkins University, Baltimore, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); G01N 23/087 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/087 (2013.01); A61B 6/4241 (2013.01); A61B 6/481 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/5217 (2013.01); A61B 6/585 (2013.01); A61B 6/586 (2013.01); G01N 23/04 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/4078 (2013.01); A61B 6/483 (2013.01); A61B 6/5294 (2013.01);
Abstract
An embodiment in accordance with the present invention provides a new SR compensation (SRC) method, using a more efficient conjugate gradient method. In this method, the first and second derivatives are directly calculated analytically. The proposed SRC uses a sinogram restoration approach, integrates the SRF as a part of a forward imaging model, and compensates for the effect of the SR by maximizing the Poisson log-likelihood of measurements. The algorithm can be evaluated using as a simulated fan-beam x-ray CT scanner.