The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Apr. 01, 2016
Applicant:

The United States of America, As Represented BY the Secretary of the Army, Washington, DC (US);

Inventors:

Bradley W. Libbey, Alexandria, VA (US);

James D. Perea, Alexandria, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/1702 (2013.01); G01H 9/00 (2013.01); G01N 2201/067 (2013.01); G01N 2201/0683 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

A laboratory system has demonstrated the measurement of three degrees of vibrational freedom simultaneously using a single beam through heterodyne speckle imaging. The random interference pattern generated by the illumination of a rough surface with coherent light can be exploited to extract information about the surface motion. The optical speckle pattern is heterodyne mixed with a coherent reference. The recorded optical data is then processed to extract three dimensions of surface motion. Axial velocity is measured by demodulating the received time-varying intensity of high amplitude pixels. Tilt, a gradient of surface velocity, is calculated by measuring speckle translation following reconstruction of the speckle pattern from the mixed signal.


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