The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Apr. 29, 2016
Applicant:

The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);

Inventors:

Almir D. Davis, Quincy, MA (US);

William J. Trinkle, Arlington, MA (US);

Donald Gustafson, Lexington, MA (US);

Philip S. Babcock, IV, Westford, MA (US);

Richard T. Berthold, Ashland, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01); G01N 27/82 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 17/00 (2013.01); G01N 27/82 (2013.01); G01N 2021/8861 (2013.01); G01N 2021/8864 (2013.01);
Abstract

Defects in ferromagnetic materials are detected and characterized by analyzing the items' magnetic fields to find portions of the magnetic fields that differ in characteristic ways from residual magnetic fields generated by non-defective portions of the items. The portions of the magnetic fields that differ in the characteristic ways correspond to locations of the defects. The residual magnetic fields correspond to portions of the items distant from the defects. The defect characterization may include volume of material lost due to each defect and/or width and/or depth of each defect.


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