The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Oct. 22, 2013
Applicant:

Honda Motor Co., Ltd., Tokyo, JP;

Inventors:

Kazunari Inamori, Tokyo, JP;

Hideo Suzuki, Tokyo, JP;

Susumu Tanaka, Tokyo, JP;

Seiichiro Naka, Tokyo, JP;

Yuji Sezaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 15/00 (2006.01); G01M 13/02 (2006.01); G01M 13/04 (2006.01); G01B 5/14 (2006.01); F16H 57/12 (2006.01); F16H 25/22 (2006.01);
U.S. Cl.
CPC ...
G01M 13/023 (2013.01); F16H 57/12 (2013.01); G01B 5/14 (2013.01); G01B 5/146 (2013.01); G01M 13/04 (2013.01); F16H 25/2209 (2013.01);
Abstract

This backlash measurement device measures the backlash existing between a first part and a second part that is provided with: a left pressing piece (L) and a right pressing piece (R) that rotate together with the second part, that pass through the center of rotation (), and that extend the same distance from the center of rotation; a left pressing mechanism (L) that presses the left pressing piece and a right pressing mechanism (R) that presses the right pressing piece; a displacement amount detection mechanism () that comes into contact with the right pressing piece and that measures the displacement amount of the left pressing piece and the displacement amount of the right pressing piece; and a calculation unit () that determines backlash on the basis of the left displacement amount and the right displacement amount detected by the displacement amount detection mechanism.


Find Patent Forward Citations

Inamori, Kazunari. (2017). Backlash measurement device and backlash measurement method (U.S. Patent No. 9651451). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9651451

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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