The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jun. 24, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Tomokazu Ishikawa, Yokohama, JP;
Shinjiro Hori, Yokohama, JP;
Tetsuya Suwa, Yokohama, JP;
Hidetsugu Kagawa, Kawasaki, JP;
Yumi Yanai, Yokohama, JP;
Wakako Tanaka, Inagi, JP;
Tohru Ikeda, Yokohama, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An image processing apparatus has: a generating unit configured to generate inspection target image data on the basis of read image data; a setting unit configured to set inspection target areas from the inspection target image data; and an extracting unit configured to extract a unique portion by applying a predetermined process to the set inspection target areas. The setting unit sets the inspection target areas so as to make the ratio of inspection target areas to the entire image area of the inspection target image data in a predetermined direction larger than the ratio of inspection target areas to the entire image area in a direction intersecting with the predetermined direction.