The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Nov. 25, 2013
Applicant:
Perfect Vision Technology (Hk) Ltd., Tsuen Wan, N.T., HK;
Inventor:
Junzhong Liang, Fremont, CA (US);
Assignee:
Perfect Vision Technology (HK) Ltd., Tsuen Wan, NT, HK;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/18 (2006.01); A61B 3/036 (2006.01); A61B 3/00 (2006.01); A61B 3/028 (2006.01); A61B 3/10 (2006.01); A61B 3/15 (2006.01); G06F 19/00 (2011.01); G02C 7/02 (2006.01);
U.S. Cl.
CPC ...
A61B 3/18 (2013.01); A61B 3/0025 (2013.01); A61B 3/0033 (2013.01); A61B 3/0058 (2013.01); A61B 3/0083 (2013.01); A61B 3/0285 (2013.01); A61B 3/036 (2013.01); A61B 3/1015 (2013.01); A61B 3/152 (2013.01); G02C 7/02 (2013.01); G06F 19/321 (2013.01); G06F 19/322 (2013.01); G02C 2202/22 (2013.01);
Abstract
The present disclosure provides methods, devices, and systems for automated measured correction of the eyes and provision of sunglasses and eyeglasses for individuals, including individuals with a visual acuity of 20/20 or better. Methods, devices and systems for remote measurement of refraction by an examiner away from the measurement system are also disclosed.