The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Dec. 15, 2014
Nidek Co., Ltd., Gamagori-shi, Aichi, JP;
NIDEK CO., LTD., Gamagori, JP;
Abstract
A control method of a fundus examination apparatus constructed as a perimeter for examining a fundus of an examinee's eye, includes: controlling a monitor provided in the fundus examination apparatus as the perimeter to display a two-dimensional map pertinent to a two-dimensional analysis result of the fundus based on a tomographic image of the examinee's eye obtained by an optical coherence tomography device; setting an examination position in the fundus examination apparatus as the perimeter on the two-dimensional map displayed on the monitor; and controlling the fundus examination apparatus as the perimeter based on the set examination position to examine the fundus.