The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Apr. 23, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Takehiro Fujita, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04J 14/02 (2006.01); H04B 10/079 (2013.01); H04B 10/50 (2013.01); H04B 10/564 (2013.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
H04J 14/0256 (2013.01); H04B 10/07955 (2013.01); H04B 10/506 (2013.01); H04B 10/564 (2013.01); H04J 14/0221 (2013.01); H04J 14/0227 (2013.01);
Abstract

A measuring device includes an identifying unit configured to identify a design value of a central frequency of spectrum of an optical signal for each of sub-channels, the optical signal being formed in Nyquist pulse, the sub-channels forming a super-channel in wavelength division multiplexing communication; and a measurer configured to measure the power of the optical signal in a band for each of the sub-channels, the identified design value of the central frequency of the band being a central frequency of the band, the band being narrower than a frequency band of a corresponding one of the sub-channels.


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