The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Jun. 08, 2014
Applicants:

Lingping Guan, San Jose, CA (US);

Madhur Bobde, Sunnyvale, CA (US);

Anup Bhalla, Santa Clara, CA (US);

Yeeheng Lee, San Jose, CA (US);

John Chen, Palo Alto, CA (US);

Moses Ho, Campbell, CA (US);

Inventors:

Lingping Guan, San Jose, CA (US);

Madhur Bobde, Sunnyvale, CA (US);

Anup Bhalla, Santa Clara, CA (US);

Yeeheng Lee, San Jose, CA (US);

John Chen, Palo Alto, CA (US);

Moses Ho, Campbell, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01); H01L 29/06 (2006.01); H01L 21/225 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/10 (2006.01); H01L 21/266 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0634 (2013.01); H01L 21/2253 (2013.01); H01L 29/66712 (2013.01); H01L 29/7802 (2013.01); H01L 21/266 (2013.01); H01L 29/1095 (2013.01);
Abstract

This invention discloses a method for manufacturing a semiconductor power device on a semiconductor substrate supporting a drift region composed of an epitaxial layer. The method includes a first step of growing a first epitaxial layer followed by forming a first hard mask layer on top of the epitaxial layer; a second step of applying a first implant mask to open a plurality of implant windows and applying a second implant mask for blocking some of the implant windows to implant a plurality of dopant regions of alternating conductivity types adjacent to each other in the first epitaxial layer; and a third step of repeating the first step and the second step by applying the same first and second implant masks to form a plurality of epitaxial layers, each of which is implanted with the dopant regions of the alternating conductivity types. Then the manufacturing processes proceed by carrying out a device manufacturing process on a top side of the epitaxial layer on top of the dopant regions of the alternating conductivity types with a diffusion process to merge the dopant regions of the alternating conductivity types as doped columns in the epitaxial layers.


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