The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Jul. 17, 2013
Applicants:

Snu R&db Foundation, Seoul, KR;

Asta Co. Ltd., Gyeonggi-do, KR;

Inventors:

Taeghwan Hyeon, Seoul, KR;

Myung Soo Kim, Seoul, KR;

Yong Jin Bae, Seoul, KR;

Kyung Man Park, Seoul, KR;

Sung Hee Ahn, Gyeonggi-do, KR;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/0027 (2013.01); H01J 49/164 (2013.01);
Abstract

Methods are described for improving reproducibility of mass spectrum and quantitative analysis method using the same. More particularly, methods for improving reproducibility of a mass spectrum of a chemical compound, wherein temperatures of an ion generation reaction are controlled to be the same with each other, or wherein spectra of which temperature of ion generation reaction are the same with each other are selected from mass spectra of a chemical compound are described. In addition, methods for measuring an equilibrium constant of a proton transfer reaction between a matrix and an analyte at a certain temperature, for obtaining a calibration curve for quantitative analysis, and for quantitative analysis of an analyte by using mass spectra area described.


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