The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Jul. 09, 2013
Siemens Aktiengesellschaft, Munich, DE;
Fabrice Dierre, Granville, FR;
Edgar Göderer, Forchheim, DE;
Peter Hackenschmied, Nuremberg, DE;
Steffen Kappler, Effeltrich, DE;
Björn Kreisler, Hausen, DE;
Miguel Labayen De Inza, Forchheim, DE;
Daniel Niederlöhner, Erlangen, DE;
Mario Reinwand, Breitbrunn, DE;
Christian Schröter, Bamberg, DE;
Karl Stierstorfer, Erlangen, DE;
Matthias Strassburg, Klagenfurt, AT;
Justus Tonn, Forchheim, DE;
Stefan Wirth, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, in particular for use in a CT system. In an embodiment, the detector includes a semiconductor material used for detecting the x-ray radiation; at least one collimator; and at least one radiation source, to irradiate the semiconductor material with additional radiation. In at least one embodiment, the at least one collimator includes at least one reflection layer on a side facing the semiconductor material, on which the additional radiation is reflected to the semiconductor material. In another embodiment, a CT system including the direct-converting x-ray radiation detector, and a method for detecting incident x-ray radiation via a direct-converting x-ray radiation detector, in particular for use in a CT system, are disclosed.