The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Jul. 31, 2014
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Michael Goessel, Mahlow, DE;

Sven Hosp, Potsdam, DE;

Guenther Niess, Potsdam, DE;

Klaus Oberlaender, Neubiberg, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); G11C 29/10 (2006.01); G06F 11/263 (2006.01); G11C 29/42 (2006.01); G06F 11/10 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G06F 11/1048 (2013.01); G06F 11/263 (2013.01); G11C 29/42 (2013.01); G11C 2029/0411 (2013.01);
Abstract

A circuit arrangement for detecting memory errors is provided. The circuit arrangement comprises a memory () and an error detection circuit (). The circuit arrangement is designed to store a code word of an error detection code (C) or a code word that is inverted in a subset (M) of bits in the memory () at a memory location and to read out a data word from the memory () from the memory location. The error detection circuit () is designed, for the case where a control signal present assumes a first value, to indicate a memory error if the data word is not a code word of the error detection code (C). Furthermore, the error detection circuit () is designed, for the case where the control signal present assumes a second value, which is different from the first value, and the code word that is inverted in the subset (M) of bits was written to the memory location, to determine on the basis of the data word read out from the memory () whether a memory error is present if the code word that is inverted in the subset (M) of bits is not a code word of the error detection code (C).


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Goessel, Michael. (2017). Circuit arrangement and method with modified error syndrome for error detection of permanent errors in memories (U.S. Patent No. 9646716). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9646716

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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