The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Nov. 16, 2015
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Jeffrey R. O'Konski, Savage, MN (US);

Garrick F. Shurts, Savage, MN (US);

Greg A. Schmitz, Princeton, MN (US);

Gregory P. Shaffer, Rosemount, MN (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/31 (2006.01); G11B 5/48 (2006.01); B24B 37/013 (2012.01); B24B 37/04 (2012.01); B24B 49/10 (2006.01); G11B 5/147 (2006.01); G11B 5/187 (2006.01); G11B 5/60 (2006.01);
U.S. Cl.
CPC ...
G11B 5/4826 (2013.01); B24B 37/013 (2013.01); B24B 37/048 (2013.01); B24B 49/10 (2013.01); G11B 5/147 (2013.01); G11B 5/187 (2013.01); G11B 5/3166 (2013.01); G11B 5/3169 (2013.01); G11B 5/3173 (2013.01); G11B 5/6082 (2013.01);
Abstract

A method of manufacturing a magnetic read-write head, including the steps of presenting a row bar to a processing location, the row bar including an air bearing surface, at least one read-write head, at least one electronic lapping guide, and at least one trigger device, wherein each electronic lapping guide is positioned at a different distance from the air bearing surface than each trigger device, and wherein the read-write head and at least one of the trigger devices include a multi-layer stack of materials; lapping the air bearing surface while measuring the electrical resistance of at least one electronic lapping guide and at least one trigger device until the resistance measurement of the trigger device provides an open circuit reading, and measuring an offset resistance value of the at least one electronic lapping guide concurrently with the measurement of the open circuit reading by the trigger device.


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