The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Apr. 02, 2014
Applicants:

Guillermo J. Tearney, Cambridge, MA (US);

Milen Shishkov, Watertown, MA (US);

Brett Eugene Bouma, Quincy, MA (US);

Benjamin J. Vakoc, Cambridge, MA (US);

Norman S. Nishioka, Wayland, MA (US);

Inventors:

Guillermo J. Tearney, Cambridge, MA (US);

Milen Shishkov, Watertown, MA (US);

Brett Eugene Bouma, Quincy, MA (US);

Benjamin J. Vakoc, Cambridge, MA (US);

Norman S. Nishioka, Wayland, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 5/0062 (2013.01); A61B 5/0066 (2013.01); A61B 5/0084 (2013.01); A61B 5/6852 (2013.01);
Abstract

Arrangements, apparatus, systems and systems are provided for obtaining data for at least one portion within at least one luminal or hollow sample. The arrangement, system or apparatus can be (insertable via at least one of a mouth or a nose of a patient. For example, a first optical arrangement can be configured to transceive at least one electromagnetic (e.g., visible) radiation to and from the portion. A second arrangement may be provided at least partially enclosing the first arrangement. Further, a third arrangement can be configured to be actuated so as to position the first arrangement at a predetermined location within the luminal or hollow sample. The first arrangement may be configured to compensate for at least one aberration (e.g., astigmatism) caused by the second arrangement and/or the third arrangement. The second arrangement can include at least one portion which enables a guiding arrangement to be inserted there through. Another arrangement can be provided which is configured to measure a pressure within the at least one portion. The data may include a position and/or an orientation of the first arrangement with respect to the luminal or hollow sample.


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