The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Jan. 20, 2015
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;
Houliang Hu, Guangdong, CN;
Li-wei Chu, Guangdong, CN;
Shenzhen China Star Optoelectronics Technology Co., Ltd, Shenzhen, Guangdong, CN;
Abstract
An automatic detection method for defects of a display panel is disclosed, which comprises: acquiring a tag image, a mapped original image and a mapped tag image; dividing the mapped original image into a plurality of mapped original sub-images, and dividing the mapped tag image into a plurality of mapped tag sub-images; acquiring a normal area and a defective area of the mapped original sub-images; merging the mapped original sub-images to discriminate the normal area and the defective area of the mapped original sub-images; correcting the discriminated normal area and the discriminated defective area of the mapped original sub-images by using the mapped tag image and the tag image to acquire a defect location of the display panel. The automatic detection method for defects of the display panel can accurately acquire the location of the defect and the difference between the defective area and the normal area to quantify and discriminate the defects of the display panel.