The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Aug. 12, 2014
Applicant:
Amazon Technologies, Inc., Reno, NV (US);
Inventors:
Bradley Lawrence Hinkel, Kirkland, WA (US);
William Nathan John Hurst, Seattle, WA (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); H04N 5/23245 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10144 (2013.01); G06T 2207/20201 (2013.01);
Abstract
An system having an aperture configured to change state while recording one or more images during an image capture process, and a method for processing one or more recorded images by detecting at least a bokeh artifact within the one or more images and processing the images based at least in part on information obtained by analyzing the size and orientation of the bokeh artifact.