The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Sep. 27, 2013
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Bo Liu, Beijing, CN;

Weizhen Yan, Beijing, CN;

Lei Li, Beijing, CN;

Zhenning Tao, Beijing, CN;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 17/5036 (2013.01);
Abstract

The embodiments of the present invention provide a nonlinear term selection apparatus and method, an identification system and a compensation system. The selection apparatus comprises: a linear coefficient calculator configured to measure linear properties of a nonlinear system by using measurement data, so as to obtain a plurality of linear coefficients; and a nonlinear term selector configured to select nonlinear model expanded terms of the nonlinear system by using the plurality of linear coefficients, so as to obtain nonlinear terms of the nonlinear system. With the embodiments of the present invention, the nonlinear model may be simplified, and the complexity of the nonlinear model may be lowered.


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