The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Mar. 22, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Yoshiyuki Taki, Utsunomiya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is an optical scanning apparatus, including: a deflection unit; and an imaging optical element (IOE) guiding a light flux deflected by deflection unit onto a scanned surface, in which, an fθ coefficient of IOE, a focal length of IOE, and when an intersection between deflection unit and an optical axis of IOE is set as an origin, a coordinate in an optical axis direction (OAD) of an intersection between a principal ray of an outermost off-axis light flux and an incident surface of IOE, a coordinate in OAD of an intersection between principal ray of outermost off-axis light flux and an exit surface of IOE, a coordinate in OAD of an intersection between a principal ray of an on-axis light flux and the incident surface, and a coordinate in OAD of an intersection between principal ray of on-axis light flux and the exit surface are appropriately set.