The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Sep. 10, 2015
Apple Inc., Cupertino, CA (US);
Byung Duk Yang, Cupertino, CA (US);
Chia Hsuan Tai, Sunnyvale, CA (US);
Hiroshi Osawa, Sunnyvale, CA (US);
Kyung Wook Kim, Cupertino, CA (US);
Ming-Chin Hung, Cupertino, CA (US);
Shang-Chih Lin, Los Altos, CA (US);
Shih Chang Chang, Cupertino, CA (US);
Yu Cheng Chen, San Jose, CA (US);
Yuan Chen, Santa Clara, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A display may have upper and lower display layers. A layer of liquid crystal material may be interposed between the upper and lower display layers. The display layers may have substrates. The display layers may include a color filter layer having an array of color filter elements on a glass substrate and a thin-film transistor layer having a layer of thin-film transistor circuitry on a glass substrate. Dielectric layers within the display layers such as dielectric layers within the thin-film transistor layer may have differing indices of refraction. Reflections and color shifts due to index of refraction discontinuities may be minimized by interposing graded index dielectric layers between adjacent layers with different indices. The graded index layers may be formed from structures with a continuously varying index of refraction or structures with a step-wise varying index of refraction.