The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Mar. 18, 2015
Nikon Corporation, Tokyo, JP;
Naoshi Aikawa, Tokyo, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A line of sight detection device calibration method, which calibrates a line of sight detection device that measures movement of an eyeball of a subject wearing eyeglasses and detects a transmission point at which a line of sight of the subject passes through a lens of the eyeglasses based on a result of measurement, includes: a measurement step of measuring the movement of the eyeball of the subject in a condition in which a first baseline is arranged at a predetermined position relative to the lens of the eyeglasses and the first baseline reflected in a corner cube substantially corresponds to a second baseline of the corner cube; and a calibration step of calibrating the line of sight detection device based on a result of measurement by the measurement step.