The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Feb. 13, 2013
Applicant:

Sharp Kabushiki Kaisha, Osaka-shi, Osaka, JP;

Inventors:

Kentarou Imamura, Osaka, JP;

Takahumi Shimatani, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/60 (2014.01); G02B 27/22 (2006.01); G02B 17/00 (2006.01); G02B 5/08 (2006.01); G02B 5/09 (2006.01);
U.S. Cl.
CPC ...
G02B 27/2292 (2013.01); G02B 5/0816 (2013.01); G02B 5/09 (2013.01); G02B 17/006 (2013.01); G02B 17/008 (2013.01);
Abstract

A reflective imaging element that may be manufactured in a convenient method and obtain a high quality aerial picture is provided. A reflective imaging element of an embodiment includes a first reflective element and a second reflective element including a light receiving surface to receive light from a projected material and an emitting surface, parallel to the light receiving surface, to emit the light from the projected material. When a ratio of light contributing to imaging out of the light from the projected material is defined as a ratio of amount of light and an incident angle of the light from the projected material when the ratio of amount of light is highest to the light receiving surface is defined as a maximum incident angle, the maximum incident angle of the first reflective element and the maximum incident angle of the second reflective element are different from each other.


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