The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Sep. 03, 2013
Landmark Graphics Corporation, Houston, TX (US);
Zitao Xu, Katy, TX (US);
Genbao Shi, Sugar Land, TX (US);
Chikang David Chien, Sugar Land, TX (US);
Jeffrey Yarus, Houston, TX (US);
Richard L. Chambers, Yukon, OK (US);
LANDMARK GRAPHICS CORPORATION, Houston, TX (US);
Abstract
A method to generate a global grid may include storing at least one data structure representing a plurality of fault blocks associated with one or more faults in a geographic formation; selecting two fault blocks associated with a fault of the one or more faults; changing the position of a first of the two fault blocks in the at least one data structure representative of a shift of the first fault block towards the other fault block of the two fault blocks to position the center of gravity of a fault boundary of the first fault block with the center of gravity of a fault boundary of the other fault block; aligning the first fault block with the other fault block according to a permitted level of conflict between fault blocks; and updating the at least one data structure to indicate a merging of the two selected fault blocks.