The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Feb. 01, 2013
Björn Heismann, Erlangen, DE;
Mathias Nittka, Baiersdorf, DE;
Peter Speier, Erlangen, DE;
Aurélien Stalder, Nürnberg, DE;
Björn Heismann, Erlangen, DE;
Mathias Nittka, Baiersdorf, DE;
Peter Speier, Erlangen, DE;
Aurélien Stalder, Nürnberg, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
A method and a measuring-sequence-determining device for determining a measuring sequence for a magnetic resonance system based on at least one intra-repetition-interval time parameter are provided. During the determination of the measuring sequence in a gradient-optimization method, gradient-pulse parameters of the measuring sequence are automatically optimized to reduce at least one gradient-pulse-parameter maximum value. As a boundary condition in the gradient-optimization method, the intra-repetition-interval time parameter is kept constant at least within a specified tolerance value.