The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Sep. 16, 2011
William David Mawby, Greenville, SC (US);
Jimmy Jeter, Greenville, SC (US);
Jonathan Sauls, Greenville, SC (US);
James Michael Traylor, Greenville, SC (US);
William David Mawby, Greenville, SC (US);
Jimmy Jeter, Greenville, SC (US);
Jonathan Sauls, Greenville, SC (US);
James Michael Traylor, Greenville, SC (US);
MICHELIN RECHERCHE et TECHNIQUE S.A., Granges-Paccot, CH;
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN, Clermont-Ferrand, FR;
Abstract
Systems and methods for improving tire uniformity include identifying at least one candidate process harmonic and corresponding period. A set of uniformity waveforms is then collected for each test tire in a set of one or more test tires. To provide better data for analysis, the collection of waveforms may include multiple waveforms including measurements obtained before and/or after cure, in clockwise and/or counterclockwise rotational directions, and while the tire is loaded and/or unloaded. The uniformity waveforms may be re-indexed to the physical order of the at least one candidate process harmonic, and selected data points within the waveforms may optionally be deleted around a joint effect or other non-sinusoidal effect. The re-indexed, optionally partial, waveforms may then be analyzed to determine magnitude and azimuth estimates for the candidate process harmonics. Aspects of tire manufacture may then be modified in a variety of different ways to account for the estimated process harmonics.