The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Oct. 22, 2013
The Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Robert A. Norwood, Tucson, AZ (US);
Khanh Q. Kieu, Tucson, AZ (US);
Roland Himmelhuber, Tucson, AZ (US);
The Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Abstract
Probe beams are scanned with respect to waveguide substrates to generate optical harmonics. Detection of the optical harmonic radiation is used to image waveguide cores, claddings, or other structures such as electrodes. The detected optical radiation can also be used to provide estimates of linear electrooptic coefficients, or ratios of linear electrooptic coefficients. In some cases, the poling of polymer waveguide structures is monitored during fabrication based on a second harmonic of the probe beam. In some examples, third harmonic generation is used for imaging of conductive layers.