The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Aug. 17, 2015
The Boeing Company, Chicago, IL (US);
Bobby J. Marsh, Lake Stevens, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Jeffrey R. Thompson, Auburn, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems and methods for infrared thermographic inspection of large-scale composite structures such as sections of an aircraft fuselage. Optical metrology is used to precisely locate the infrared images relative to a three-dimensional coordinate system of the composite structure. The optical metrology may comprise laser tracking or photogrammetry or both. In some embodiments, the optical metrology comprises laser tracking merged with photogrammetry. Once the infrared images have been precisely located relative to the coordinate system of the composite structure, structural data about the composite structure (e.g., thickness data) can be retrieved from a database containing a three-dimensional model of the composite structure. In the case of thermographic porosity measurements, the infrared imaging data can be correlated with thickness data to determine the porosity of the composite structure in the inspection area.