The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Jul. 01, 2008
Bernhard Wieneke, Goettingen, DE;
Bernhard Wieneke, Goettingen, DE;
LAVISION GMBH, Goettingen, DE;
Abstract
The invention relates to a method for the contact-free measurement of deformations of a surface of a object in which a series of individual images is captured in each of two time windows (T, T), wherein between every two individual image captures the image detector is displaced relative to the object and parallel to its detector surface by an optical offset of the size of a fraction of a pixel up to a few pixels, the individual images of the first time window (T) are processed in pairs with the individual images of the second time window (T) to produce a set of individual deformation fields () and an average of the individual deformation fields () is calculated as an output deformation field ().