The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Jul. 08, 2015
Applicant:
Sick Ag, Waldkirch/Breisgau, DE;
Inventors:
Assignee:
SICK AG, Waldkirch/Breisgau, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/04 (2006.01); G01S 17/10 (2006.01); G01S 7/487 (2006.01); G01S 17/87 (2006.01);
U.S. Cl.
CPC ...
G01B 11/04 (2013.01); G01S 7/4873 (2013.01); G01S 17/10 (2013.01); G01S 17/87 (2013.01);
Abstract
A method of measuring an object by means of at least one first laser scanner is described which detects measured values for a plurality of measurement points, wherein only measured values which lie above a predefined threshold value are used for measuring the object. The method is characterized in that threshold values are determined separately for at least two ranges of measurement points of the laser scanner or laser scanners and the threshold value used for a measurement point is selected in dependence on a quality criterion.