The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Oct. 16, 2014
Applicant:

Hexagon Metrology Sas, Courtaboeuf, FR;

Inventor:

Laurent Desforges, Ambloy, FR;

Assignee:

HEXAGON METROLOGY SAS, Courtaboeuf, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/008 (2006.01); G01B 5/008 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 7/008 (2013.01); G01B 5/008 (2013.01); G01B 21/047 (2013.01); G01B 2210/00 (2013.01);
Abstract

Method for measuring a part using an articulated measurement arm having a measurement head provided with a pointing member and at least one joint fitted with at least one rotary encoder, comprising focusing on a first measurement point on the part, the measurement arm adopting a first measurement position, moving the measurement arm to a second measurement position to focus on a second measurement point of the part in order to capture a geometric feature of the part on the basis of the measurement points, and determining a degree of precision of the capture of the geometric feature undertaken as a function of the first and second positions of the measurement arm.


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