The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Feb. 10, 2012
Applicants:

Takeshi Sakurai, Aizuwakamatsu, JP;

Yoshio Abe, Aizuwakamatsu, JP;

Naotake Hirano, Aizuwakamatsu, JP;

Inventors:

Takeshi Sakurai, Aizuwakamatsu, JP;

Yoshio Abe, Aizuwakamatsu, JP;

Naotake Hirano, Aizuwakamatsu, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22C 9/00 (2006.01); C22C 9/06 (2006.01); C22F 1/08 (2006.01);
U.S. Cl.
CPC ...
C22F 1/08 (2013.01); C22C 9/00 (2013.01); C22C 9/06 (2013.01);
Abstract

Provided are a Cu—Zr-based copper alloy plate which retains satisfactory mechanical strength and, at the same time, has a good balance of bending formability and bending elastic limit at a high level and a process for manufacturing the Cu—Zr-based copper alloy plate. The copper alloy plate contains 0.05% to 0.2% by mass of Zr and a remainder including Cu and unavoidable impurities, and the average value of KAM values measured by an EBSD method using a scanning electron microscope equipped with a backscattered electron diffraction pattern system is 1.5° to 1.8°, the R/t ratio is 0.1 to 0.6 wherein R represents the minimum bending radius which does not cause a crack and t represents the thickness of the plate in a W bending test, and the bending elastic limit is 420 N/mmto 520 N/mm.


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