The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Apr. 04, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Guillaume Laroche, Melesse, FR;

Patrice Onno, Rennes, FR;

Edouard François, Bourg-des-Comptes, FR;

Christophe Gisquet, Rennes, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/12 (2006.01); G09G 5/00 (2006.01); H04N 19/14 (2014.01); H04N 19/117 (2014.01); H04N 19/82 (2014.01); H04N 19/86 (2014.01); H04N 19/176 (2014.01); H04N 19/34 (2014.01);
U.S. Cl.
CPC ...
H04N 19/14 (2014.11); H04N 19/117 (2014.11); H04N 19/176 (2014.11); H04N 19/82 (2014.11); H04N 19/86 (2014.11); H04N 19/34 (2014.11);
Abstract

A method and a device for classifying samples of an image, each sample having a respective sample value the method comprising repartition of each of the samples into a plurality of index classes, wherein the index class allocated to each sample is determined in dependence upon the sample value of the said sample with respect to the sample values of first neighboring samples of said sample according to a given direction and further in respect to the sample values of the first neighboring samples with respect to the sample values of samples neighboring the first neighboring samples according to the said given direction. Processing each sample according to the respective allocated index class.


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