The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Mar. 31, 2015
Heidelberger Druckmaschinen Ag, Heidelberg, DE;
Frank Schumann, Heidelberg, DE;
Winfried Berg, Heidelberg, DE;
Heidelberger Druckmaschinen AG, Heidelberg, DE;
Abstract
A method for automatically selecting test parameters for an image inspection system using a computer, includes digitizing a reference image or a scanned printed image to determine target values, categorizing the image elements that are present, determining tolerances for the target values based on the categorization, calculating the inspection sensitivity based on target values and the respective tolerances thereof, setting the parameters of the image inspection system based on the inspection sensitivity, and configuring the image inspection using these parameters. An image inspection system for implementing the method is also provided.