The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Jan. 22, 2013
Systems and methods for collaborating in a non-destructive testing system using location information
General Electric Company, Schenectady, NY (US);
Michael Christopher Domke, Skaneateles, NY (US);
Sekhar Soorianarayanan, Bangalore, IN;
Thomas Eldred Lambdin, Auburn, NY (US);
Robert Carroll Ward, Essex, CT (US);
Scott Leo Sbihli, Lexington, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A collaboration system for sharing data in a non-destructive testing (NDT) system may include a first computing device that may receive data that has been acquired using one or more NDT inspection devices. The first computing device may then establish a communication connection between itself and some other computing device such that the communication connection may enable the first computing device to share data with the other computing device. After establishing the communication connection, the first computing device may determine location information that corresponds to the data. Using the location information, the first computing device may then determine one or more assets that correspond to the data. The first computing device may then identify information associated with the assets and display the information.