The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9640238 B1

PDF
Full Text
Expired
Date of Patent:
May. 02, 2017

Filed:

May. 14, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Satoru Ogasahara, Aichi, JP;

Yuhei Yoshimoto, Hyogo, JP;

Yoshikazu Katoh, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/16 (2006.01); G11C 13/00 (2006.01); G11C 11/56 (2006.01); G11C 29/06 (2006.01); G11C 29/36 (2006.01);
U.S. Cl.
CPC ...
G11C 11/16 (2013.01); G11C 11/5685 (2013.01); G11C 13/004 (2013.01); G11C 13/0035 (2013.01); G11C 29/06 (2013.01); G11C 29/36 (2013.01); G11C 13/0007 (2013.01); G11C 2013/0054 (2013.01); G11C 2211/5644 (2013.01);
Abstract

A data generating device includes: a memory cell array including a plurality of memory cells; a read circuit operative to obtain a plurality of resistance value information pieces from the plurality of memory cells; and a data generator circuit operative to set a condition on the basis of the plurality of resistance value information pieces, and generating data by allocating, on the basis of the condition, the plurality of resistance value information pieces into a plurality of sets which respectively correspond to a plurality of values constituting the data. Each of the plurality of memory cells has a characteristic where, when in a variable state, a resistance value thereof reversibly changes between a plurality of variable resistance value ranges in accordance with an electric stress applied.


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