The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Apr. 03, 2015
Decision Sciences International Corporation, Poway, CA (US);
Chuanyong Bai, Poway, CA (US);
Joel Kindem, San Diego, CA (US);
Weidong Luo, San Diego, CA (US);
Matthew Steiger, El Cajon, CA (US);
Sean Simon, Vista, CA (US);
Michael James Sossong, Ramona, CA (US);
Decision Sciences International Corporation, Poway, CA (US);
Abstract
Disclosed technology can provide a process for generating reconstructed muon image resolution to optimize the use of the limited angular range muon track data collected by a muon tomography system. In one aspect, a process for improving reconstructed muon image resolution for a volume of interest (VOI) imaged by a muon tomography system includes: collecting raw muon track data of cosmic ray muon tracks passing through the VOI; grouping the raw muon track data into two or more subsets of tracks based on at least one angular distribution of the muon tracks in the raw muon track data; generating a set of images of the VOI based on the two or more subsets of tracks; and combining information from the set of reconstructed images and a reconstructed image based on the full set of the raw muon track data to obtain a resulting reconstructed image of the VOI.