The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Dec. 22, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

David Peter Morgan-Mar, Wollstonecraft, AU;

Matthew Raphael Arnison, Umina Beach, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0071 (2013.01); G06T 7/0069 (2013.01); G06T 2207/20021 (2013.01);
Abstract

Methods, apparatuses, and computer readable storage media are provided for determining a depth measurement of a scene using an optical blur difference between two images of the scene. Each image is captured using an image capture device with different image capture device parameters. A corresponding image patch is identified from each of the captured images, motion blur being present in each of the image patches. A kernel of the motion blur in each of the image patches is determined. The kernel of the motion blur in at least one images patch is used to generate a difference convolution kernel. A selected first image patch is convolved with the generated difference convolution kernel to generate a modified image patch. A depth measurement of the scene is determined from an optical blur difference between the modified image patch and the remaining image patch.


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