The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Sep. 24, 2015
Applicant:
Stmicroelectronics (Grenoble 2) Sas, Grenoble, FR;
Inventor:
Marina Nicolas, Voreppe, FR;
Assignee:
STMicroelectronics (Grenoble 2) SAS, Grenoble, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/00 (2017.01); H04N 19/176 (2014.01); H04N 19/117 (2014.01); H04N 19/86 (2014.01); H04N 19/14 (2014.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 7/0002 (2013.01); H04N 19/117 (2014.11); H04N 19/14 (2014.11); H04N 19/176 (2014.11); H04N 19/86 (2014.11); G06T 2207/10004 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20004 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20172 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A method involving: detecting in an image a first type of artifact (A) to generate a first artifact value (G) and a first confidence level (C); detecting in the image a second type of artifact (A) to generate a second artifact value (G) and a second confidence level (C); and performing correction of the first type of artifact (A) in the image based on the first and second artifact values (G, G) and the relative values of the first and second confidence levels (C, C).