The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Dec. 23, 2016
Sas Institute Inc., Cary, NC (US);
Deovrat Vijay Kakde, Cary, NC (US);
Sergiy Peredriy, Auburndale, MA (US);
Arin Chaudhuri, Raleigh, NC (US);
Anya M. McGuirk, Holly Spring, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device identifies outliers. Support vectors, Lagrange constants, a center threshold value, an upper control limit value, and a lower control limit value are received that define a normal operating condition of a system. The center threshold value, the upper control limit value, and the lower control limit value are computed from the vectors and the Lagrange constants. A first plurality of observation vectors is received for a predefined window length. A window threshold value and a window center vector are computed. A window distance value is computed between the window center vector and the support vectors. Based on comparisons between the computed values and the received values, the first plurality of observation vectors is identified as an outlier relative to the normal operating condition of the system. When the first plurality of observation vectors are identified as the outlier, an alert is output.